The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
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چکیده
منابع مشابه
The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy
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ژورنال
عنوان ژورنال: AIP Advances
سال: 2013
ISSN: 2158-3226
DOI: 10.1063/1.4818119